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Microwave Electronics: Measurement and Materials Characterization by L. F. Chen , C. K. Ong Book Details
| Book Name | Microwave Electronics: Measurement and Materials Characterization |
| Author | L. F. Chen , C. K. Ong |
| Category | Electronics & Communication Engineering, Education Books |
| Book Language | English |
| Publisher | John Wiley & Sons |
| Pages | 549 |
| Country | India |
| Book Size | 8 MB |
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About Microwave Electronics: Measurement and Materials Characterization by L. F. Chen , C. K. Ong Book
Microwave Electronics: Measurement and Materials Characterization is a specialized field within the broader domain of electronics and electromagnetic engineering. It focuses on the techniques, methods, and technologies used to measure and characterize microwave devices, circuits, and materials. Microwave frequencies typically range from hundreds of megahertz (MHz) to tens of gigahertz (GHz), and they are essential for various applications including wireless communication, radar systems, satellite communication, and more.
Here are some key aspects of Microwave Electronics: Measurement and Materials Characterization:
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Measurement Techniques: Microwave measurements involve the accurate determination of various parameters related to microwave devices and circuits. Common measurement techniques include vector network analysis (VNA), spectrum analysis, time-domain reflectometry (TDR), and power measurements. These techniques help in understanding the behavior of microwave systems and components.
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Characterization of Devices: Microwave devices include components such as amplifiers, filters, antennas, mixers, and oscillators. Characterization involves assessing their performance parameters, such as gain, frequency response, bandwidth, noise figure, and distortion. Accurate characterization ensures that devices meet their intended specifications.
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Material Properties: Microwave materials characterization involves studying how different materials interact with microwave electromagnetic fields. Dielectric constant, loss tangent, and conductivity are important properties that affect how materials interact with microwaves. These properties are crucial for designing microwave circuits and antennas.
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Dielectric Measurements: Dielectric materials play a significant role in microwave electronics. Techniques like cavity perturbation, resonant cavities, and open-ended coaxial probes are used to measure dielectric properties of materials. This is important for designing microwave components and systems that utilize dielectric materials.
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Waveguide Measurements: Waveguides are structures that guide microwave signals along their path. Characterizing waveguide parameters such as impedance, attenuation, and mode distribution helps in designing efficient waveguide-based systems.
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Non-Destructive Testing: Microwave techniques can be used for non-destructive testing of materials. This includes assessing the structural integrity of materials, detecting defects, and measuring material properties without causing damage.
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Material Absorption: Some materials absorb microwave energy at specific frequencies. This property is exploited in applications like microwave heating and medical imaging.
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Calibration and Error Correction: Accurate measurement in microwave electronics requires careful calibration and error correction. Calibration standards and procedures are used to ensure measurement accuracy and repeatability.
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Advanced Techniques: With advancements in technology, more sophisticated measurement techniques have emerged. Time-domain measurements, scattering parameter analysis, and near-field measurements are some of the advanced methods used for microwave characterization.
Microwave Electronics: Measurement and Materials Characterization play a crucial role in the development of microwave-based technologies. Accurate measurement and characterization techniques are essential for designing reliable and high-performance microwave components, circuits, and systems across a wide range of applications, from telecommunications to defense and medical technologies.
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